Special Issue: 26th International Symposium on VLSI Design and Test 2022
Journal: Springer Analog Integrated Circuits and Signal Processing
Editors: A. P. Shah, and S. Dasgupta
Guest Editorial: 26th International Symposium on VLSI Design and Test 2022
Journal: Elsevier Memories - Materials, Devices, Circuits and Systems
Editors: A. P. Shah, and B. S. Reniwal