Editorials

Special Issue: 26th International Symposium on VLSI Design and Test 2022

Journal: Springer Analog Integrated Circuits and Signal Processing

Editors: A. P. Shah, and S. Dasgupta

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Guest Editorial: 26th International Symposium on VLSI Design and Test 2022

Journal: Elsevier Memories - Materials, Devices, Circuits and Systems

Editors: A. P. Shah, and B. S. Reniwal

Link