Title: VLSI Design and Test

Editors: A. P. Shah, S. Dasgupta, A. Darji, and J. N. Tudu

ISBN: 978-3-031-21513-1

Status: Published

ISBN: 978-3-031-21514-8

Title: Energy-Efficient and Reliable Embedded Nanoscale SRAM Design

Authors: B. S. Reniwal, P. Singh, A. P. Shah, and S. K. Vishvakarma

Status: Published

ISBN: 9781003213451

Title: Reliability Issues in Digital Integreted Circuits

Authors: A. P. Shah, and S. K. Vishvakarma

Status: In Press

Title: Low Power and Reliable CMOS Circuit Design

Authors: N. Gupta, A. P. Shah, and S. K. Vishvakarma

Status: In Press